Conference Paper

Pathogenic variability of Phaeoisariopsis griseola in Kenya and its implications in resistance of common bean to angular leaf spot

author(s)

Wagara, I

regions
  • Kenya
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full citation

Wagara, Isabel; Mwang`ombe, A.W.; Kimenju, J.W.; Buruchara, Robin A.; Kimani, Paul M. 2005. Pathogenic variability of Phaeoisariopsis griseola in Kenya and its implications in resistance of common bean to angular leaf spot . In: General Meeting of Biotechnology, Breeding & Seed Systems for African Crops (2, 2005, Nairobi, Kenya). Biotechnology, breeding and seed systems for African crops: Abstracts. Rockefeller Foundation, Nairobi, KE. 1 p.